Speaker
Description
Usually, a volume of IMS Xe sample is not exceeding a few cc of pure Xe and volume of OSI sample is significant less. Proposed technology increased Xe volume for more than 100 times and provide high sensitivity spectrometric measurement (MDC for Xe133, Xe135, Xe133m and Xe135 always during the measurement were less than 10-5 Bq/m3). MDC for 4 Xe are by several orders less than MDC of existing IMS Xe Systems. The presentation shows a principal of the big sample technology including preparation of Xe-Kr concentrate, sample purification process, spectrometric measurement and familiar with obtaining results. This technology could significantly increase the performance of NG method and significant improve treaty verification regime: extension IMS station under request; Xe background study; temporary replacement of IMS equipment due to the technical problems with XE equipment by request and etc.
| [email protected] |
